Book: Transmission Electron Microscopy and Diffractometry of Materials
Experimental methods for diffraction and microscopy are pushing the front
edge of nanoscience and materials science, and important new developments
are covered in this third edition. For transmission electron microscopy, a remarkable
recent development has been a practical corrector for the spherical
aberration of the objective lens. Image resolution below 1?A can be achieved
regularly now, and the energy resolution of electron spectrometry has also
improved dramatically. Locating and identifying individual atoms inside materials
has been transformed from a dream of fifty years into experimental
methods of today.
The entire field of x-ray spectrometry and diffractometry has benefited
from advances in semiconductor detector technology, and a large community
of scientists are now regular users of synchrotron x-ray facilities. The
development of powerful new sources of neutrons is elevating the field of neutron
scattering research. Increasingly, the most modern instrumentation for
materials research with beams of x-rays, neutrons, and electrons is becoming
available through an international science infrastructure of user facilities that
grant access on the basis of scientific merit.
The fundamentals of scattering, diffractometry and microscopy remain as
durable as ever. This third edition continues to emphasize the common theme
of how waves and wavefunctions interact with matter, while highlighting the
special features of x-rays, electrons, and neutrons. The third edition is not
substantially longer than the second, but all chapters were updated and revised.
The text was edited throughout for clarity, often minimizing sources
of confusion that were found by classroom teaching. There are significant
changes in Chapters 1, 3, 7, 8 and 9. Chapter 11 is new, so there are now
12 chapters in this third edition. Many chapter problems have been tuned to
minimize ambiguity, and the on-line solutions manual has been updated.
We thank Drs. P. Rez and A. Minor for their advice on the new content
of this third edition. Both authors acknowledge support from the National
Science Foundation for research and teaching of scattering, diffractometry,